Modelling of Electron and Ion Dynamics in the Electron Cyclotron Resonance Ion Source by Means of Pic-self Consistent Numerical Simulations*

The properties of Electron Cyclotron Resonance Ion Sources (ECRIS) plasmas, up to now, have been largely studied on the basis of a global approach. However the design of new generation sources, able to provide high intensity beams of multiply charged ions, requires a more accurate investigation of both electron and ion dynamics. Recent experiments have demonstrated that even slight frequency’s changes (of the order of MHz) considerably influence the output current, and what’s more important, even the extracted beam properties (beam shape, brightness and emittance) are affected [1,2]. The paper will briefly describe the approach used to simulate the phenomena observed by referring to some recent papers for further details.